2 article(s) from Wahl, Michael
Absence of free carriers in silicon nanocrystals grown from phosphorus- and boron-doped silicon-rich oxide and oxynitride
- Daniel Hiller,
- Julian López-Vidrier,
- Keita Nomoto,
- Michael Wahl,
- Wolfgang Bock,
- Tomáš Chlouba,
- František Trojánek,
- Sebastian Gutsch,
- Margit Zacharias,
- Dirk König,
- Petr Malý and
- Michael Kopnarski
Beilstein J. Nanotechnol. 2018, 9, 1501–1511, doi:10.3762/bjnano.9.141
Precise in situ etch depth control of multilayered III−V semiconductor samples with reflectance anisotropy spectroscopy (RAS) equipment
- Ann-Kathrin Kleinschmidt,
- Lars Barzen,
- Johannes Strassner,
- Christoph Doering,
- Henning Fouckhardt,
- Wolfgang Bock,
- Michael Wahl and
- Michael Kopnarski
Beilstein J. Nanotechnol. 2016, 7, 1783–1793, doi:10.3762/bjnano.7.171
Other Beilstein-Institut Open Science Activities
